index - PCM Accéder directement au contenu

Derniers dépôts

Chargement de la page

Rechercher

Nombre de documents

77

Nombre de notices

277

Mots-clés

Scanning electron microscopy TEM CHLORINE PLASMAS Colloidal solution Transfert d'énergie CIGSe Structure Low-pressure plasma processing Atomic layer etching AZO thin films Band gap Resistive switching TiO2 C Photoelectron spectroscopy A Multilayers SF 6 Chalcogenide glass Ablation laser PECVD Chemical and biological sensors Physical vapor deposition Residual stress Thin films X-ray photoelectron spectroscopy Anatase A3 Physical vapor deposition processes Aluminium nitride Thin film A Chalcogenides Carbon Nanotube Argon InP chlorine etching inductive coupled plasma ICP modeling plasma sheath simulation Films BOMBARDMENT Biofilms microbiens Spectroscopic ellipsometry Plasmas froids AuCu alloy A-CNx Band alignment Nanotubes Biocapteurs Magnetron sputtering CaTiO3Pr^3^+ A1 Characterization Ambipolar material Carbon nitride Functionalization Nanocomposite Oxides CNTs’ collapse Sol-gel Transmission electron microscopy Cathepsin Alzheimer's disease Atomic force microscopy Mott insulators Biomasse B3 Solar cells B2 Quaternary XPS Selenization Kirkendall effect Sputtering Semiconductors AlN Carbon Bixbyite Adsorption Plasma etching B1 Inorganic compounds Capacitance Avalanche breakdown X-ray diffraction Bipolar resistive switching BRS Chalcogenides Vanadium Sesquioxide Aryl-diazonium salts Non-volatile memory Amorphous Calcined clay Applications industrielles Chemical detection Alloying 3 nm in size Titanium dioxide Optical properties Amyloid precursor NEXAFS B2 Semiconducting indium compounds Carbon nanotubes V2O3 CH4 Copper B2 Semiconducting alloys Buffer Couple Etching A Thin films B Chemical synthesis Mott insulator Chalcogenide